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In the field of electron microscopy electrons are used to visualize and analyze the structure, morphology and composition of a sample at an atomic level achieving a resolution up to 50 pm. Usually, either with a "parallel" electron beam or scanned with an electron probe an atomic-level understanding of structures, properties and fundamental mechanisms in structural, functional and electronic materials can be gained.
Applicants are encouraged to select at least 2 techniques from the choices available at the same or different facilities.
For advice on techniques or participating facilities before submitting a proposal, talk to our Expert Network at sciencesupport@remade-project.eu and/or submit a pre-proposal using the Call link in the top navigation bar.