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The focused ion beam (FIB) technique is a high-resolution imaging and microfabrication technology that uses a focused beam of ions to selectively remove or deposit material at the nanoscale level. FIB instruments are typically based on a scanning electron microscope (SEM) to visualize the sample and a focused beam of gallium ions to precisely remove or deposit material.
Applicants are encouraged to select at least 2 techniques from the choices available at the same or different facilities.
For advice on techniques or participating facilities before submitting a proposal, talk to our Expert Network at sciencesupport@remade-project.eu and/or submit a pre-proposal using the Call link in the top navigation bar.