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X-ray diffraction (XRD) enables the identification of crystalline materials by their atomic structure. Through the analysis of the XRD data, one can retrieve the different phase(s) in the sample from the peaks position, while the intensities of the peaks provide information about the quantity of each crystalline phase present in the sample. Finally, the analysis of the peak broadening provides insights into the crystallite size and micro-strain in the crystal.
Applicants are encouraged to select at least 2 techniques from the choices available at the same or different facilities.
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